CPSC/ECEN 680 Paper

Out: 1/17/2008

Due: 3/7/2008 by end of day

Project Procedure

Assignment

Write a well-researched and well-written paper describing the test topic of your choice, with proper literature citations. The paper can be no more than 6 pages of 10-pt or larger font, including any figures and references. It should be in two-column format in the style of a conference paper. It should follow the organization and writing style of a typical conference or journal paper. The IEEE Computer Society Press conference proceedings Word format is here. Figures from the literature may be scanned rather than redrawn if the result is clearly readable, and you include a proper citation (e.g. a citation number in the figure caption). Badly written papers will be returned to you for rewriting.

Good sources of paper ideas include the IEEE Transactions on CAD, IEEE Transactions on VLSI, IEEE Transactions on Computers, Springer Journal of Electronic Testing: Theory and Applications (JETTA), IEEE International Test Conference, IEEE VLSI Test Symposium, ACM/IEEE Design Automation Conference, IEEE International Conference on CAD, etc. Most of these are available online at the IEEE (http://ieeexplore.ieee.org) and ACM (http://www.acm.org/dl) digital libraries, accessible from a TAMU IP address. The textbook contains a very extensive reference list guide to the literature, which is probably the best starting point for identifying an interesting topic.